JH60C-High And Low Temperature Magnetic Field Type Hall Effect Test System
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High And Low Temperature Magnetic Field Type Hall Effect Test System
Hall Effect Tester - High and Low Temperature Magnetic Field Type Thermometer, system software. The JH10 effector specially developed for this instrument system integrates a constant current source, a six-and-a-half-digit microvoltmeter and a complex switching relay-switch for Hall measurement, which greatly simplifies the connection and operation of the experiment.
Product Description:
The instrument system consists of: electromagnet, electromagnet power supply, high precision constant current source high precision voltmeter, Gauss meter, Hall effect sample holder, standard sample, high and low temperature Dewar, temperature controller, system software. The JH10 effect meter specially developed for this instrument system integrates a constant current source, a six-and-a-half-digit microvoltmeter and a complex switching relay-switch for Hall measurement, which greatly simplifies the connection and operation of the experiment. JH10 can be used alone as a constant current source and a microvoltmeter. It is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, the Hall effect test system is to understand and study semiconductor devices. It is a must-have tool for the electrical properties of semiconductor materials. The experimental results are automatically calculated by the software, and the Bulk Carrier oncentration, Sheet Carrier Concentration, Mobility, Resistivity, and Hall coefficients can be obtained at the same time. Coefficient), magnetoresistance (Magnetoresistance) and so on.
Testable Materials:
Semiconductor materials: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials;
Low impedance materials: graphene, metals, transparent oxides, weak magnetic semiconductor materials, TMR materials, etc.;
High-resistance materials: semi-insulating GaAs, GaN, CdTe, etc.
Technical Indicators:
* Electromagnet magnetic field: 10mm spacing is 2T, 30mm spacing is 1T
* Sample current: 0.05uA~50mA (adjust 0.1nA)
* Measuring voltage: 0.1uV~30V
* Provide various test standard materials, various grades of silicon and gallium arsenide (different sensitivity and precision)
* Resolution minimum: 0.1GS
* Magnetic field range: 0-1T
* With the Gauss meter or data acquisition board can communicate with computer
* I-V curve and I-R curve measurement, etc.
* Variation curve of parameters such as Hall coefficient and carrier concentration with temperature
*Resistivity range：5*10-5～5*102Ω.cm
* esistance range：10 m Ohms~ 6MOhms
*carrier concentration：5*1012～51*1020cm-3
*Hall coefficient：±1*10-2～±1*106cm3/C
* mobility：0.1~108cm2/volt*sec
* Temperature adjustment： 0.1K
*Temperature zone: 78K-475K, room temperature-773K (optional)
* Fully automated testing, one-click processing
* Can achieve continuous measurement between the same temperature difference
Maximum magnetic field 20000Gs when N, S spacing is 10mm
Maximum 13000 Gauss when N, S spacing is 20mm
Maximum magnetic field 10000 Gauss when N, S distance is 30mm
Uniformity area: uniformity range of 10mm diameter when the spacing is 60mm; 1%
Weight 210 kg (including brackets and wheels)
High Precision Bipolar Constant Current Power Supply
② The current can smoothly cross the zero point, non-switching commutation
③ Four-quadrant operation of output current and voltage (suitable for inductive loads)
※ High current stability and low ripple
①Current stability: better than ±25ppm/h (standard type); better than ±5ppm/h (high stability type)
② Current accuracy: ±(0.01% set value + 1mA)
③ Current resolution: 20 bit, for example 15A power supply, current resolution is 0.03mA
⑤ Load effect: ≤ 2.0×10-5 F.S. (when the load changes by 10%, the output current changes)
⑥ Current ripple (RMS): less than 1mA
Resolution: 0.01mT Range: 0-3T
Rs-232 interface data reading software with GP3 probe
Sample Holder Fixture (Customized Upon Request)
High And Low Temperature Thermostat:
(80K-470K) high and low temperature vacuum container
TESTIK301 thermostat temperature control (65k-600k)
Constant current source and test table
Constant current source range: ±50nA-±50mA;
Resolution 0.1nA continuously adjustable within the range;
High-precision voltage data acquisition instrument range 0. 1uV-30V
Constant Current Source And Test Table
Constant current source range: ±50nA-±50mA
Resolution 0.1nA Continuously adjustable within the range
High-precision voltage data acquisition instrument range 0. 1uV-30V
Built-in test matrix conversion card
Ohmic contact kit: make kits based on ohmic contacts of different materials
